Alpha-Particle Induced Soft-Error Rate in CMOS 130 nm SRAM

Abstract

2010 Conference on Radiation and its Effects on Components and Systems (RADECS), Langenfeld, GERMANY, SEP 20-24, 2010International audienceWe report the modeling and simulation of the soft-error rate (SER) in CMOS 130 nm SRAM induced by alpha-particle emission in silicon due to uranium contamination at ppb concentration levels. Monte-Carlo simulation results have been confronted to experimental data obtained from long-duration (>20 000 h) real-time measurements performed at the under-ground laboratory of Modane (LSM) and from experimental counting characterization using an ultra low background alpha-particle gas proportional counter. The calibration of simulations with the measured SER allowed us to determine a U-238 contamination level of 0.37 ppb (considered at secular equilibrium) in very good agreement with both corresponding alpha-particle emissivity levels measured and simulated at wafer-level in the range 1.1 to 2.3 x 10(-3) alpha/cm(2)/h

Defining a strategy to perform life-tests with analog devices

“…However, interesting results have arisen from life tests performed in ground or underground laboratories [1]- [8], in avionics [9]- [11], or in operative space satellites [12], [13].…”