29th VLSI Test Symposium 2011
DOI: 10.1109/vts.2011.5783783
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An analytical method for estimating SET propagation

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Cited by 6 publications
(6 citation statements)
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“…A simplification of the method in [5] is described. The simplification is due to the fact that in diagnosis we know precisely when the error pulse occur within the latching window at only one observable point.…”
Section: Preliminaries On Set Propagationmentioning
confidence: 99%
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“…A simplification of the method in [5] is described. The simplification is due to the fact that in diagnosis we know precisely when the error pulse occur within the latching window at only one observable point.…”
Section: Preliminaries On Set Propagationmentioning
confidence: 99%
“…As in our previous work [4], [5], the SET effect at an observable point is defined as the product of the probability of generating an SET at a gate at time t and the probability to propagate the generated SET to the observable point. The SET generation probability was proposed in our previous work [4].…”
Section: Introductionmentioning
confidence: 99%
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