2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) 2021
DOI: 10.1109/sdemped51010.2021.9605489
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An Automated Multi-Device Characterization System for Reliability Assessment of Power Semiconductors

Nathan Zhang1,
Shi Pu2,
Bilal Akin3
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Cited by 3 publications
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Automated Characterization in Cryocon 22C at Wide Temperature Range using LabVIEW

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