2023 2nd International Conference on Electronics, Energy and Measurement (IC2EM) 2023
DOI: 10.1109/ic2em59347.2023.10419392
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An Efficient Extraction of the Bias Dependent Extrinsic Resistances of the HEMT GaN/SiC

Boumediene Zatout,
Djabar Maafri,
Salim Kerai
et al.
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