An electro-thermo-mechanical coupling phase-field model of defect evolution induced by electromigration in interconnects

Wu, Xin-Wei; Chen, Mingyang; Ke, Liao-Liang

doi:10.1016/j.ijmecsci.2024.109792

International Journal of Mechanical Sciences

2025

DOI: 10.1016/j.ijmecsci.2024.109792

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An electro-thermo-mechanical coupling phase-field model of defect evolution induced by electromigration in interconnects

Xin-Wei Wu,

Mingyang Chen,

Liao-Liang Ke

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An electro-thermo-mechanical coupling phase-field model of defect evolution induced by electromigration in interconnects

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References 79 publications

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