An electronic energy model for multi-stacking faults in reducing carrier lifetime in 4H-SiC epitaxial layers

Hou, Pengxiang; Wang, Pin; Li, Yifei; Zhong, Weiliang; Han, Yuebin; Wang, Jing; Yu, Le; Li, Zheyang; Jin, Rui

doi:10.1016/j.jcrysgro.2024.128005

Journal of Crystal Growth

2025

DOI: 10.1016/j.jcrysgro.2024.128005

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An electronic energy model for multi-stacking faults in reducing carrier lifetime in 4H-SiC epitaxial layers

Pengxiang Hou,

Pin Wang,

Yifei Li

et al.

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An electronic energy model for multi-stacking faults in reducing carrier lifetime in 4H-SiC epitaxial layers

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References 34 publications

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