Articles you may be interested inAnalysis of electrical charging and discharging kinetics of different glasses under electron irradiation in a scanning electron microscope J. Appl. Phys. 108, 093705 (2010); 10.1063/1.3499692 Scenario for time evolution of insulator charging under various focused electron irradiations J. Appl. Phys. 95, 731 (2004); 10.1063/1.1632015 Quantitative measurement of surface potential and amount of charging on insulator surface under electron beam irradiationThe charge properties, under electron irradiation, of three types of glasses are studied by employing scanning electron microscope ͑SEM͒ associated with the technique called the electrostatic influence method. The experimental conditions are closed to those of typical field emission display ͑FED͒ operation. To determine the amount of trapped charges during and after electron irradiation, a special arrangement adapted to the SEM was used. This arrangement allows displacement and leakage currents to be simultaneously measured. The secondary electron emission yield during electron irradiation is also deduced. The trapping ability of each glass is analyzed taking into account the regulation mechanisms involved under electron irradiation. Finally useful indications permitting an adequate selection of glasses that may be used as FED spacers are deduced.