2019 IEEE Applied Power Electronics Conference and Exposition (APEC) 2019
DOI: 10.1109/apec.2019.8722238
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An Experimental Approach to Identify Source and Cause of Radiation Noise of Inverter Systems and Bare Si Power Chips

Toshiya Tadakuma
1
,
Michael J. Rogers
2
,
Teruaki Nagahara
3
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Cited by 4 publications
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Radiation study on the parallel topology of SiC MOSFET and Si IGBT inverter

Dai
1
,
Zheng
2
,
Peng
3
et al. 2023
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Radiation study on the parallel topology of SiC MOSFET and Si IGBT inverter

Dai
1
,
Zheng
2
,
Peng
3
et al. 2023
Energy Reports
0
0
0
0
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Empirical Radiation Noise Identification and Reduction by Optimized IGBT without Increasing Power Loss

Tadakuma
1
,
Shibata
2
,
Rogers
3
et al. 2020
2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
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Radiated Noise Dominancy Analysis by Extended Double Pulse Test and Power Device Optimization for Inverter Use

Tadakuma
1
,
Lim2,
Nishi
3
et al. 2021
2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
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