An Extended Design Methodology for LED Lighting Systems Including Lifetime Estimation

Guisso, Ronaldo António; Righi, Matheus Farencena; Mineiro, Edilson; Pinto, Rafael A.; Bender, Vitor C.; Marchesan, Tiago Bandeira

doi:10.1109/ted.2016.2620463

Cited by 5 publications

(2 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Accelerated stress tests shorten testing time by increasing test stress. Testing methods are mainly divided into two categories: accelerated life tests (ALTs) and accelerated degradation tests (ADTs) . Compared with the relatively mature ALTs, ADTs can detect the decaying process of product performance to provide more degradation information and predict life more precisely .…”

Section: Introductionmentioning

confidence: 99%

Two optimized models of life prediction based on luminance degradation for VFD under a conventional life test

Zhang

Zong

Zhang

et al. 2018

Quality & Reliability Eng

View full text Add to dashboard Cite

Focusing on improving the accuracy of existing life prediction models for optoelectronic products, the three‐parameter Weibull right approximation method (TPWRAM) was employed to substitute exponential function based on the least square method in the analysis and two‐staged methods. Two optimized models were established (Model I and Model II), based on maximum likelihood estimation and the Monte Carlo method, respectively. One group of conventional life tests (CLTs) of vacuum fluorescent display (VFD) were conducted to collect luminance degradation data for each sample, and the two optimized models were applied to achieve VFD life prediction and obtain mean time to failure, median life, and confidence intervals. The results indicate that the CLT test design is correct and feasible, the amount of data on luminance degradation is large, and the test data selection method is reasonable. Model I and Model II optimized by TPWRAM both reflect the VFD luminance variation law well, and the predicted life approaches VFD service life from user feedback, proving that the two models are precise, and thus, can provide technical references for researchers and engineers regarding aspects of life prediction.

show abstract

Section: Introductionmentioning

confidence: 99%

Two optimized models of life prediction based on luminance degradation for VFD under a conventional life test

Zhang

Zong

Zhang

et al. 2018

Quality & Reliability Eng

View full text Add to dashboard Cite

show abstract

“…Life is considered as an important index of quality and reliability, 1,2 so accurate life prediction for light-emitting devices is a significant and meaningful research topic as it may lead to savings in time and cost. [3][4][5] Therefore, it is an urgent to establish a fast, precise and efficient life prediction model.…”

Section: Introductionmentioning

confidence: 99%

A life estimation model applied to organic light-emitting diodes

Zhang

Zong

Meng³

et al. 2018

Lighting Research & Technology

View full text Add to dashboard Cite

For predicting life for light-emitting devices quickly and accurately, a novel life prediction model, namely an extrapolation model of accelerated life and stress, has been proposed. In this model, a Weibull function is employed to fit luminance decay data under multiple groups of accelerated stresses, and the corresponding accelerated life is obtained. By determination coefficients and root mean square errors, a power function is determined as an extrapolated function to describe the relationship between accelerated life and stress and the life of the light-emitting devices. For organic light-emitting diodes, three groups of constant-stress accelerated degradation tests were conducted by increasing current stress. An extrapolation model of accelerated life and stress was applied to process the collected luminance decay data and was evaluated by a careful comparison with organic light-emitting diode life. The results indicate that the self-designed experimental scheme for organic light-emitting diode is feasible and versatile; the predicted life is 17,113 hours, which is close to the service life derived from user feedback, and the relative error is only 2.2%. This shows that the extrapolation model of accelerated life and stress has high precision; the model reveals the expected law of luminance changing with time and intuitively depicts the life characteristics under accelerated stresses without conventional life tests. This will pave the way for a new method to predict and evaluate the life of modern light-emitting devices.

show abstract

System design: lighting

Costa

Wang

2023

Encyclopedia of Electrical and Electronic Power Engineering

View full text Add to dashboard Cite

An Extended Design Methodology for LED Lighting Systems Including Lifetime Estimation

Cited by 5 publications

References 16 publications

Two optimized models of life prediction based on luminance degradation for VFD under a conventional life test

Two optimized models of life prediction based on luminance degradation for VFD under a conventional life test

A life estimation model applied to organic light-emitting diodes

System design: lighting

Contact Info

Product

Resources

About