An Improved Four-Port Equivalent Circuit Model of RF MOSFETs for Breakdown Operation

Symptom reliability: S‐parameters evaluation of power laterally diffused‐metal–oxide–semiconductor field‐effect transistor after pulsed‐RF life tests for a radar application

“…This result confirmed in the study of Raman, Cortes and Hao [15][16][17][18][19][20]. Since these parameters are shifted after ageing, as thereby given also in literatures [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23].…”

“…6a. The shifts of S 12 and S 21 can be explained by the shift of G m curve and C gd variations and C rss [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19], whereas the shifts of these parameters are due to the generation of interface states induced by hot carriers after ageing. This result confirmed in the study of Raman, Cortes and Hao [15][16][17][18][19][20].…”

“…These parameters degraded due to change of physical properties in addition affecting both the S-parameters. The studies [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22] prove that the ageing device can have another effect: the stressed device reduces G m and R ds-on , which it will decrease C rss and C gd capacitances; it is focused on the dynamic parameters effects that have an important effect on RF regimes. The V th increase and the C gd decrease involves S-parameters shift.…”

“…This current is much more important than in DC polarisation case. Finally, these results are in an electrons’ injection into the oxide layer [4–23]. The trapped electrons reduce the electrical charge density and, consequently, the total charge in the affected area, in this case at the interface, between the gate oxide and the N ‐LDD overlay region.…”

“…The emission and the susceptibility allow defining the Sparameters depend very closely on the electrical and physical parameters of devices or circuits. Lately, some publications have shown that accelerated ageing tests such as high temperature, operating life or electrical overstress lead to a significant variation in S-parameters [11][12][13]. The S-parameters notion identifies the ratio between two complex quantities.…”