2024
DOI: 10.3390/electronics13193798
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An Improved Product Defect Detection Method Combining Centroid Distance and Textural Information

Haorong Wu,
Xiaoxiao Li,
Fuchun Sun
et al.

Abstract: In order to solve the problems of a high mismatching rate and being easily affected by noise and gray transformation, an improved product defect detection method combining centroid distance and textural information is proposed in this paper. Based on image preprocessing, the improved fuzzy C-means clustering method is used to extract the closed contour features. Then, the contour center distance description operator is used for bidirectional matching, and a robust coarse matching contour pair is obtained. Afte… Show more

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