1988
DOI: 10.6028/jres.093.144
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An Improvement in the reliability of standard cell enclosures

Abstract: We describe the design of a new temperature-regulation circuit, which is temperature to the ambient temperature is improved to 20 }LK/oC. This paper describes in detail the new circuit, summarizes the enclosure construction, and presents data on the performance of the system. used as an outer oven controller for new standard cell enclosures, with the emphasis on improving the reliability of the temperature control. A redundant protection circuit is used to prevent loss of temperature control caused by componen… Show more

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