An instrument for precision controlled radiation exposures, charged beam profile measurement, and real-time fluence monitoring beyond 10¹⁶ n_eq/cm²

Abstract

An instrument has been developed for precision controlled exposures of electronic devices and material samples in particle beams. The instrument provides simultaneously a real time record of the profile of the beam and the fluence received. The system is capable of treating devices with dimensional scales ranging from millimeters to extended objects of cross sections measured in tens of square centimeters. The instrument has been demonstrated to operate effectively in integrated fluences ranging up to a few times 10 16 1-MeV-neutron-equivalent/cm 2 (neq). The positioner portion of the system comprises a set of remotely controllable sample holders incorporating cooling and interfaces for sample power and readout, all constructed from low activation technologies. The monitoring component of the system samples the current or voltage of radiation tolerant silicon diodes placed directly in the path of the beam.

Investigation of low gain avalanche detectors exposed to proton fluences beyond 1015 n eq cm-2

“…These diodes function effectively up to saturation around 10 15 n eq cm −2 . The diode voltage is calibrated to fluence in Reference [12]. The average dose measured over the central 1 cm 2 region of the diode array was shown to agree well with the dose obtained using gamma spectroscopy on the Al foil.…”

Iterative Learning‐Based PID Precision Control for Sports Performance Analysis

“…Fuzziness is an expression with imprecision, incompleteness, and randomness. For example, when people are asked about the temperature of the weather, the answer is often "high temperature" or "low temperature" instead of the precise temperature value [19,20]. In the real world, it is a unique way for humans to understand the world.…”