An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction

Njeh, Anouar; Wieder, Thomas; Ghozlen, Mohamed Hédi Ben; Fueß, H.

doi:10.1016/j.matchar.2004.02.008

Cited by 2 publications

(2 citation statements)

References 9 publications

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“…Therefore, a location correction is required whereby the orientation of the scattering vector in the sample coordinate system is described in terms of the tilt and rotation of the sample. The location corrections for the polar, α, and azimuthal, β, angles are given by (Njeh et al, 2004),…”

Section: Glancing Angle Texture Measurementmentioning

confidence: 99%

A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction

2014

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Synopsis A method for accurate measurement of the texture of thin oxide films has been proposed.The method involves the separation of integrated intensities from complex glancing angle diffraction spectra and leads to an improved representation of the preferred orientation present in oxide films. AbstractThe present paper describes a modification to the standard method of glancing angle Xray diffraction for accurate measurement of the texture of thin oxide films. The technique resolves the problems caused by overlapping diffraction peaks originating from multiphase materials with asymmetric unit cells, and the peak broadening associated with sample tilt during glancing angle texture measurement. The entire two-theta range of interest is recorded as a function of sample orientation and the integrated intensities from different crystallographic planes are extracted from fitted diffraction profiles. The technique allows for pole figures to be plotted from diffraction peaks that could otherwise not be resolved and separates contributions from neighbouring peaks, leading to a more accurate representation of the existing oxide texture. The proposed method has been used for determining texture in a 3 µm layer of monoclinic/tetragonal zirconium oxide grown during aqueous corrosion testing and has been verified by additional synchrotron XRD measurements.

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Section: Glancing Angle Texture Measurementmentioning

confidence: 99%

A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction

2014

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“…Studies can include: phase composition, crystal structure, crystallite size, stress-strain analysis, texture, layers thickness, surface order-disorder transitions, diffusion behavior, crystallization rate etc. [1][2]. However, fixation of an angle (α angle) between the incident X-ray beam and sample surface leads to asymmetry in focusing of rays in GIXD technique.…”

Section: Introductionmentioning

confidence: 99%

Lattice and Peak Profile Parameters in GIXD Technique

Goryczka

Dercz

Pająk

et al. 2007

SSP

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Grazing incident X-ray diffraction technique was applied to determine the influence of incident beam angle (α angle) on structural parameters as well as peak profile. X-ray diffraction patterns were registered in asymmetrical geometry, in which a parallel beam was formed by Soller and divergence slits. Lowering of the α angle results in accuracy decrease of lattice parameters as well as in significant broadening of a half-width of X-ray diffraction line.

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An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction

Cited by 2 publications

References 9 publications

A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction

A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction

Lattice and Peak Profile Parameters in GIXD Technique

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