An on-line data collection and analysis system for VLSI devices at wafer probe and final test

Alpha 21164 manufacturing test development and coverage analysis

“…test database. 7 The test program flow facilitated unique identification of devices that failed one or more of the new patterns but none of the existing patterns. Figure 6 illustrates the defective device capture rate as well as the single stuckat fault, and the total interconnect capacitance coverage increase for several new tests.…”