An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production

Mizushima, Takeshi; Shirahata, Kazuki; Fujibe, Tasuku; Matsumura, Hidenobu; Watanabe, Daisuke; Mineo, Hiroyuki; Masuda, Shin

doi:10.1109/ats.2016.51

2016 IEEE 25th Asian Test Symposium (ATS) 2016

DOI: 10.1109/ats.2016.51

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An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production

Takeshi Mizushima

Kazuki Shirahata

Tasuku Fujibe

et al.

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An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production

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