Annual Report 1960 Conference on Electrical Insulation 1960
DOI: 10.1109/cei.1960.7461662
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An ultra low frequency bridge for dielectric measurements

Abstract: The bridge desc ribed is capable of measurin g t he p arallel capacitance and resista nce of dielectric specim e ns ill t he fr eque ncy r a nge of 0.008 to 200 cps. It employs no ear thing device a nd is directly con nected to a t hree termin al oscillator. The su bstit ut ion m ethod is employed. The capabilities of the bridge ar e experime ntall y tested by measure men ts upon known capacitors a nd resistors and by co mpa riso n with results obtained usin g a Schering bridge near 100 cps. Th e apparatus is … Show more

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“…Low-frequency frequency domain techniques to measure the complex permittivity of materials are often based on refinements [302][303][304] of sensitive methods for impedance compensation as originally designed as, for instance, Wheatstone [305,306], Wien [307], Schering [308], and Scheiber [309] bridge circuits. The principle of operation at the basis of all bridge methods is illustrated by Figure 54.…”
Section: Lcr Bridges Impedance Analyzersmentioning
confidence: 99%
“…Low-frequency frequency domain techniques to measure the complex permittivity of materials are often based on refinements [302][303][304] of sensitive methods for impedance compensation as originally designed as, for instance, Wheatstone [305,306], Wien [307], Schering [308], and Scheiber [309] bridge circuits. The principle of operation at the basis of all bridge methods is illustrated by Figure 54.…”
Section: Lcr Bridges Impedance Analyzersmentioning
confidence: 99%