Abstract:Original scientific paperA new method for detection of parametric faults occurring in analog circuits based on relative amplitude and relative phase analysis of the Circuit Under Test (CUT) is proposed. The relative amplitude is the common power change of the signals and the relative phase presents the relative phase offset of the signals. In the proposed method, the value of each component of the CUT is varied within its tolerance limit using Monte Carlo simulation. The upper and lower bounds of relative ampl… Show more
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