Journal of Electronic Testing
 2004
DOI: 10.1023/b:jett.0000023678.30564.66
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Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours

R. Rodríguez-Montañés
1
,
D. Muñoz
2
,
Luz Balado
3
et al.
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