Analysis and Control of Chaos in the Boost Converter with ZAD, FPIC, and TDAS

Abstract

This paper presents an analysis and control of chaos in the boost converter controlled with zero average dynamics, fixed-point induced control, and time-delayed autosynchronization techniques. First, the existence of chaos is demonstrated numerically when positive Lyapunov exponents are found in the controlled system, for a range from k1=−0.26 to k1=0.4387, when k2=0.5. Additionally, chaos is also found for a range from k1=−0.435 to k1=0.26, when k2=−0.5. Subsequently, fixed-point-induced control and time-delayed autosynchronization techniques are used to control the chaos. The results show that both techniques are useful to control the chaos in the boost converter. Furthermore, the fixed-point-induced control technique allows better regulation than the time-delayed autosynchronization technique. Moreover, when only the fixed-point induced control technique is used on the boost converter with a time delay, the results were not good enough to stabilize orbits. The stability is validated by calculating the Lyapunov exponents.

Impact of Chaos on MOSFET Thermal Stress and Lifetime

“…Due to the strong non-linear modeling of switching converters [9], these converters can exhibit complex dynamical behaviors such as bifurcation and chaos with variation of a bifurcation parameter [10]. This bifurcation parameter can be the load [11], the reference voltage [12], the reference current [13,14], the inductance [15] of the converter, or a control parameter [16,17]. There is a bifurcation route towards chaos when increasing or decreasing these parameters, forcing the MOSFET to operate under harsh conditions.…”