Analysis of a single-shot longitudinal bunch profiling system based on an ultra-short pulse Ti:sapphire laser

Abstract

Recent advances in ultra-short pulse high-power laser technology include the generation of <10 fs pulses at 1 µ wavelengths in the multi-terawatt regime. These parameters, coupled with the high per-pulse energy of the new sources, make possible the consideration of longitudinal bunch profiling schemes capable of accurately registering the longitudinal bunch density in a single shot. In this paper we assess the performance and advantages of a longitudinal bunch profiling system based on multi-photon absorption and fluorescence stimulated by the combined bunch and laser fields in a gaseous medium.