Analysis of Admittance Data: Comparison of a Parametric and a Nonparametric Method

Comparison of Parametric and Nonparametric Methods for the Analysis and Inversion of Immittance Data: Critique of Earlier Work

“…Although the PM used in [13] was introduced by reference to that in [4], thus implying that the method was the same, this was not the case. Therefore, it is important to present DRT estimation results for the three DRT situations defined above using the original PM.…”

“…Therefore, it is important to present DRT estimation results for the three DRT situations defined above using the original PM. Such results and their comparison with the NTRM and PM estimates of [13] are presented below. For easy distinction between the two PM approaches, let PMO denote the original version of [4] and PMW denote that used by Winterhalter et al [13].…”

“…The detailed comparisons of the usefulness of the NTRM and PM approaches carried out in [13] using Monte Carlo analysis of data with fairly low noise indicated that the NTRM was greatly superior to the PM for the inversion of a continuous distribution of relaxation times (DRT) and, as well, for a composite distribution containing three discrete lines and a continuous DRT. For the estimation of a DRT involving only three discrete lines, the PM results were superior except for uncertainty in the determination of the proper number of lines to estimate.…”

“…One of the two deconvolution methods involves the use of Tikhonov regulation [1], and the other uses complex nonlinear least-squares fitting (CNLS) of an appropriate model [2][3][4][5][6][7][8][9][10]. Recently Maier, Winterhalter, and their associates have published three papers [11][12][13] dealing with the analysis of admittance data by a nonlinear Tikhonov regularization method (NTRM): termed by them a nonparametric method. The alternate CNLS parametric method (PM) developed by the present author [4] is mentioned in [11][12][13], briefly described in [12], and discussed, applied, and apparently compared in [13] to NTRM results for both simulated and experimental noisy admittance data, the latter for semi-insulating GaAs Schottky diodes.…”

“…Recently Maier, Winterhalter, and their associates have published three papers [11][12][13] dealing with the analysis of admittance data by a nonlinear Tikhonov regularization method (NTRM): termed by them a nonparametric method. The alternate CNLS parametric method (PM) developed by the present author [4] is mentioned in [11][12][13], briefly described in [12], and discussed, applied, and apparently compared in [13] to NTRM results for both simulated and experimental noisy admittance data, the latter for semi-insulating GaAs Schottky diodes. A list of acronym definitions is included at the end of this work.…”