Analysis of alloy composition by X-ray fluorescence spectrometry using liquid and thin layer techniques with an internal standard

Mzyk, Zofia; Anyszkiewicz, Jacek; Matusiak, Henryka

doi:10.1016/j.sab.2012.03.004

Cited by 3 publications

(4 citation statements)

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“…The second approach was the preparation of the samples as thin layer samples (TL-XRF), which is often used for the analysis of water samples, [6,8,9] but alloy analysis is also possible. [10] In this case, the complete dissolution of the alloy was required, but this was easy to achieve for the examined alloys. In the next step, the resulting solution was applied to a cellulose filter and evaporated.…”

Section: Introductionmentioning

confidence: 99%

“…The repeatability and preservation of the sample composition before and after remelting were analyzed herein, which limited the potential microstructural effects and improved the calibration curve parameters. The second approach was the preparation of the samples as thin layer samples (TL‐XRF), which is often used for the analysis of water samples, but alloy analysis is also possible . In this case, the complete dissolution of the alloy was required, but this was easy to achieve for the examined alloys.…”

Section: Introductionmentioning

confidence: 99%

“…The typical measurement of liquids is achieved using polypropylene cups and foil, and TL‐XRF does not involve the presence of acidic vapors in the measuring chamber or risk direct contact of acidic liquids with the X‐ray tube in the case of an accident. Considering previous studies on the analysis of alloys, strontium (as SrCO 3 ) was used as an internal standard to compensate for potential imperfect applications of the sample solution onto the cellulose filter …”

Section: Introductionmentioning

confidence: 99%

“…Considering previous studies on the analysis of alloys, strontium (as SrCO 3 ) was used as an internal standard to compensate for potential imperfect applications of the sample solution onto the cellulose filter. [10] 2 | EXPERIMENTAL 2.1 | Instrumentation and calibration materials…”

Section: Introductionmentioning

confidence: 99%

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Novel sample treatment procedures for the determination of phosphorus in Cu‐based alloys using X‐ray fluorescence spectrometry to solve the microstructural effect issue

et al. 2017

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The accurate analysis of hard CuP and CuPAg‐type solders using X‐ray fluorescence spectrometry is a difficult task. Surface milling, the most common sample preparation method for calibration materials, results in poor accuracy for the phosphorus analysis, as evidenced by the unacceptable values of the root mean square error. Meanwhile, the analysis of real samples provides incorrect results, and microstructural effects are the main source of error. Thus, this effect was negated by considering the information depth of the phosphorus Kα line and the microstructure size of the alloys. Phosphorus was measured using a thin layer of the sample (a thickness of several micrometers). As a result, the analyzed layer was a poor representative of the sample. Two different approaches for solving the microstructural effect issue were proposed. In the first method, the alloy was remelted under controlled conditions to obtain fine‐grain samples, which successfully limited the microstructural effects. The second solution used specially prepared thin layer samples, and the sample dissolution eliminated the microstructural effect. Using the developed sample treatment methods resulted in an improvement in the accuracy of the phosphorus calibration curves. This allowed for the correct determination of phosphorus and other alloying elements in the Cu‐based alloys with low uncertainties.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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