Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach

Goudet, Esther; Sureau, Fabio; Breuil, Paul; Peña Treviño, Luis; Naviner, Lirida; Daveau, Jean-Marc; Roche, Philippe

doi:10.1007/s10836-024-06119-5

J Electron Test

2024

DOI: 10.1007/s10836-024-06119-5

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Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach

Esther Goudet,

Fabio Sureau,

Paul Breuil

et al.

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Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach

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References 40 publications

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