Analysis of optical-injected distributed feedback lasers using complex optical low-coherence reflectometry

Palavicini, C.; Campuzano, Gabriel; Thédrez, B.; Jaouën, Yves; Gallion, P.

doi:10.1109/lpt.2003.819734

Cited by 8 publications

(5 citation statements)

References 11 publications

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“…(26) from Henry (1982). Also it is important to stress that a theoretical and experimental investigation of reflectograms obtained for a DFB SL using a phasecontrolled high-resolution optical low-coherence reflectometer (OLCR) was carried out in Palavicini et al (2003). Finally, the modified linewidth method relies on the measurement of SL's linewidth as a function of emitted power under and above the laser's threshold, and the ratio of the slopes of the curves linewidth as a function of the inverse power gives directly the a H -factor value (Villafranca et al, 2005).…”

Section: Major Experimental Techniques For Measuring the A H -Factormentioning

confidence: 99%

GaAs-Based Quantum Dot Lasers

Crowley¹,

Naderi²,

Shen³

et al. 2012

Semiconductors and Semimetals

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Section: Major Experimental Techniques For Measuring the A H -Factormentioning

confidence: 99%

GaAs-Based Quantum Dot Lasers

Crowley¹,

Naderi²,

Shen³

et al. 2012

Semiconductors and Semimetals

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“…The beam in the reference arm is folded eight times in the set-up, so the path difference between the two arms is δ coh = 8n air(He-Ne) x = kλ vacuum(He-Ne) , (k∈ N), (7) which gives a sample period of…”

Section: Coherent Interferometermentioning

confidence: 99%

“…The interest in the optical low-coherence reflectometer (OLCR) cannot be denied. Many laboratories of metrology (METAS [1], NIST [2], NPL [3]) and academics worldwide are equipped with one [4][5][6][7][8][9]. It is not only used to characterize mainly optical fibres, but also provides invaluable information on the electronic components [10].…”

Section: Introductionmentioning

confidence: 99%

Uncertainties on distance and chromatic dispersion measurement using optical low-coherence reflectometry

Obaton¹,

Quoix²,

Dubard³

2008

Metrologia

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The optical low-coherence reflectometer (OLCR) is a very powerful tool to characterize optical fibres and integrated optical components. However, this is a very complex set-up and in addition to that it performs Fourier transforms. Evaluating uncertainty in these conditions becomes very complicated. To overcome this difficulty, we chose to use an alternative statistical method as partly described in the ISO5725 standard. The most significant quantities which can be extracted from the OLCR measurements are length and chromatic dispersion (CD) of the optical component. An uncertainty of 0.036 mm (k = 2) for the length and of 0.12 ps nm−1 km−1 (k = 2) for the CD can be achieved for a 1 m long G652 type fibre.

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“…Indeed, techniques such as white light interferometry 10 and optical low-coherence reflectometry (OLCR) 11 have already proven to be e↵ective in determining the dispersion of both active 12,13 and passive devices. 11,14,15 However, these techniques use of mechanical translation stages to provide variable optical delays, with limitations in the delay-span of acquisitions.…”

Section: Introductionmentioning

confidence: 99%

Spectral and temporal phase measurement by optical frequency-domain reflectometry

et al. 2014

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The capability of measuring the spectral and temporal phase of an optical signal is of fundamental importance for the advanced characterization of photonic and optoelectronic components, biochemical sensors, structural monitoring sensors and distributed sensor networks. To address this problem, several techniques have been developed (frequency-resolved optical gating (FROG), spectral phase interferometry for direct electric-field reconstruction (SPIDER), stepped-heterodyne technique, laser Doppler vibrometry (LDV) and Doppler optical coherence tomography (OCT)). However, such techniques often lack of versatility for the mentioned applications. Swept-wavelength interferometric techniques and, among these, optical frequency-domain reflectometry (OFDR) are flexible and highly sensitive tools for complete characterization of amplitude and phase of target devices.In this work, we investigate the spectral and temporal phase measurement capabilities of OFDR. Precise characterization of spectral phase information is demonstrated by retrieving the phase response of a commercial optical filter, the Finisar Waveshaper 1000 S/X, programmable in attenuation and phase over C+L band (1530-1625 nm). The presented results show accurate retrieval of group delay dispersion (GDD) and discrete phase shift as well as filter attenuation profile. Although some intrinsic accuracy limitations of OFDR phase measurements may be encountered (and herein specified), we show that information encoded in OFDR reflectogram data is very rich when adequately exploited. In addition to previously published results, we demonstrate the high sensitivity of the technique to Doppler e↵ects. From practical point of view, such sensitivity can be beneficially exploited for the characterisation of dynamical aspects of samples under test. Unlike LDV, OFDR allows the simultaneous retrieval of the temporal position of several localised reflecting target along the beam path. All these aspects make OFDR a highly promising candidate for the study of both static and dynamic aspects of complex photonic components or to probe a parallel sensor network, as needed for future applications.

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Analysis of optical-injected distributed feedback lasers using complex optical low-coherence reflectometry

Cited by 8 publications

References 11 publications

GaAs-Based Quantum Dot Lasers

GaAs-Based Quantum Dot Lasers

Uncertainties on distance and chromatic dispersion measurement using optical low-coherence reflectometry

Spectral and temporal phase measurement by optical frequency-domain reflectometry

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