Analysis of Point-Diffraction Wavefront with Sub-Wavelength-Aperture Fiber

Xixi, 陈茜茜 Chen; Daodang, 王道档 Wang; Yangbo, 徐杨波 Xu; Ming, 孔明 Kong; Tiantai, 郭天太 Guo; Jun, 赵军 Zhao; Baohua, 朱保华 Zhu

doi:10.3788/aos201535.0912004

光学学报

2015

DOI: 10.3788/aos201535.0912004

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Analysis of Point-Diffraction Wavefront with Sub-Wavelength-Aperture Fiber

陈茜茜 Chen Xixi¹,

王道档 Wang Daodang²,

徐杨波 Xu Yangbo³

et al.

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High-precision method for submicron-aperture fiber point-diffraction wavefront measurement

Wang¹,

Xu²,

Liang³

et al. 2016

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It is a key issue to measure the point-diffraction wavefront error, which determines the achievable accuracy of point-diffraction interferometer (PDI). A high-precision method based on shearing interferometry is proposed to measure submicron-aperture fiber point-diffraction wavefront with high numerical aperture (NA). To obtain the true shearing point-diffraction wavefront, a double-step calibration method based on three-dimensional coordinate reconstruction and symmetric lateral displacement compensation is proposed to calibrate the geometric aberration in the case of high NA and large lateral wavefront displacement. The calibration can be carried out without any prior knowledge about the system configuration parameters. With the true shearing wavefront, the differential Zernike polynomials fitting method is applied to reconstruct the point-diffraction wavefront. Numerical simulation and experiments have been carried out to demonstrate the accuracy and feasibility of the proposed measurement method, and a good measurement accuracy is achieved.

show abstract

High-precision method for submicron-aperture fiber point-diffraction wavefront measurement

Wang¹,

Xu²,

Liang³

et al. 2016

Opt. Express

View full text Add to dashboard Cite

show abstract

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Analysis of Point-Diffraction Wavefront with Sub-Wavelength-Aperture Fiber

Cited by 1 publication

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High-precision method for submicron-aperture fiber point-diffraction wavefront measurement

High-precision method for submicron-aperture fiber point-diffraction wavefront measurement

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