2021
DOI: 10.1134/s1061830921080039
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Analyzing the Influence of Thermal NDT Parameters on Test Performance

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Cited by 5 publications
(2 citation statements)
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“…This type of stimulation is mainly used in two manners: (i) a simple uniform stimulation applied during a period (transient thermal tests) and (ii) a cyclic stimulation modulated as a sinusoidal wave. These last ones are called Lock-in Thermal Tests (LTTs) [ 1 , 2 ].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…This type of stimulation is mainly used in two manners: (i) a simple uniform stimulation applied during a period (transient thermal tests) and (ii) a cyclic stimulation modulated as a sinusoidal wave. These last ones are called Lock-in Thermal Tests (LTTs) [ 1 , 2 ].…”
Section: Introductionmentioning
confidence: 99%
“…Flash, Transient, and lock-in thermography are the classic Infrared Thermography NDT techniques. These require an intense heat source (transient test) or a well-controlled and linear power source [ 2 , 5 ]. To overcome these drawbacks, frequency-modulated stimulations have been studied by Mulaveesala and by Rani [ 29 , 30 ].…”
Section: Introductionmentioning
confidence: 99%