Angular dependence of the reflectance and transmittance of CdS films formed by laser ablation

Abstract

Articles you may be interested inPhotoluminescence study of polycrystalline photovoltaic CdS thin film layers grown by close-spaced sublimation and chemical bath deposition J. Appl. Phys. 105, 064515 (2009); 10.1063/1.3074504 Water soluble CdS nanoparticles with controllable size prepared via femtosecond laser ablationThe dependence of reflectance and transmittance on the angle of incidence and the polarization of visible light was measured for thin (Ϸ2 m) CdS films formed by laser ablation. The experiments were carried out at 300 K with argon and He-Ne lasers. In the blue and green spectral ranges, the experiments were described straightforwardly by the theoretical approach for highly absorptive materials, omitting the film thickness. For red light, the sample represents dielectric material and multiple reflections must be considered to fit the experiments. Furthermore, it is shown that the angular-dependent features of red light are an accurate tool to determine the film thickness.