Angular Studies of Potential Electron Emission in the Interaction of Slow Ions with Al Surfaces

Riccardi, P.; Barone, P.; Bonanno, A.; Oliva, A.; Baragiola, R. A.

doi:10.1103/physrevlett.84.378

Cited by 42 publications

(22 citation statements)

References 17 publications

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“…29 These differences between actual measurement results of SE yield in a HIM, and calculations are attributed to SE generation mechanisms not considered in the calculations. Indications exist that bulk plasmon excitations can play an important role 29,40 for SE generation in HIM. An actual measurement of SE yield as a function of SE energy and the work function dependence of the distribution maximum is presented in Fig.…”

Section: Secondary Electronsmentioning

confidence: 98%

Helium ion microscopy

Hlawacek

Veligura

Gastel

et al. 2014

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

213

155

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Helium ion microcopy based on gas field ion sources represents a new ultrahigh resolution microscopy and nanofabrication technique. It is an enabling technology that not only provides imagery of conducting as well as uncoated insulating nanostructures but also allows to create these features. The latter can be achieved using resists or material removal due to sputtering. The close to free-form sculpting of structures over several length scales has been made possible by the extension of the method to other gases such as neon. A brief introduction of the underlying physics as well as a broad review of the applicability of the method is presented in this review.

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Section: Secondary Electronsmentioning

confidence: 98%

Helium ion microscopy

Hlawacek

Veligura

Gastel

et al. 2014

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

213

155

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“…It has received a great deal of attention in the past because it gives an insight into the Physics of electron-solid interactions [3] and has many applications such as electrical discharges, surface analysis and space environment [4]. In our previous work [5], we also gave a novel design of a cylindrically symmetric VEPALS system based on secondary electron (SE) emission from carbon foil.…”

Section: Introductionmentioning

confidence: 98%

Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils

Yang

Cai

et al. 2011

Nuclear Instruments and Methods in Physics Research Section B:

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a b s t r a c tSecondary electron (SE) emission from thin carbon foils induced by 1-20 keV positrons has been investigated over a range of nominal foil thicknesses from 1:0 to 5:0 lg=cm 2 . The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield c has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter K ¼ c=ðdE=dxÞ and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE Àm and m is close to 1. For low energy incident positrons, however, another form, BexpðÀE=tÞ, is proposed for describing the SE distribution.

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“…For an ion far from the surface the capture mechanism is dominated by the plasmon-assisted process, now exciting surface plasmons. 16,17 Then we expect T C to be of the order of 1/ sp , sp being the surface plasmon energy. The mean time between collisions C increases with the distance to the surface, typically C ϳe z/d , and then it is much larger than in the bulk.…”

Section: A Bulk Casementioning

confidence: 99%

Quantum-mechanical time-dependent calculation for Auger processes in the volume of metals

García

Monreal

2000

Phys. Rev. B

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Auger charge-transfer processes occurring in the volume of metals have been formulated in full quantum mechanically. The time-dependent Hamiltonian describing these processes is written down using the jellium model, and solved using the Keldysh Green function formalism. Our calculated self-energies take into account single-particle and plasmon excitations. We find the mathematical conditions under which the quantummechanical solution will be well approximated by the semiclassical solution of a rate equation. We perform numerical calculations for the He/Al system, and find that the semiclassical solution is an excellent approximation in this case.

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Angular Studies of Potential Electron Emission in the Interaction of Slow Ions with Al Surfaces

Cited by 42 publications

References 17 publications

Helium ion microscopy

Helium ion microscopy

Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils

Quantum-mechanical time-dependent calculation for Auger processes in the volume of metals

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