Application of a New Method of Non-Adhesion Defect Simulation in Multilayer Honeycomb Structures from Polymer Composite Materials for Various Nondestructive Testing Methods

Abstract

A new method of non-adhesion defect simulation in multilayer honeycomb structures from polymer composite materials is discussed. This simulation method is particularly relevant for honeycomb structures with large cells. An experimental model for the comparison of two simulation methods, a new one and flat-bottom hole simulation, was fabricated. Advantages and features of application of the new simulation method for the nondestructive testing methods such as impedance, free oscillation, and through-transmission ultrasonic and thermal methods are shown.