Application of EMMI contrast method in failure analysis

Chen, Xuanlong; Kuang, Xianjun; Xu, Guangning

doi:10.1109/ipfa.2013.6599211

Cited by 3 publications

(1 citation statement)

References 8 publications

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“…To identify the exact location of the leakage current, we have characterized the CTIA circuit by means of emission microscopy (EMMI) measurements which have been used extensively [27,28,29,30]. The left picture in the Fig.…”

Section: Discussionmentioning

confidence: 99%

Investigation of soft ESD failure on capacitive transimpedance amplifier for hybrid integrated infrared sensor

Wang

Xia

2020

IEICE Electron. Express

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In this letter, an experiment is designed to validate the soft ESD failure. The capacitive transimpedance amplifier (CTIA) circuit used in the hybrid integrated infrared sensor is chosen as the prototype for its characteristic of ESD-protection-device-free. The experiments show that under the ESD event with the rising pulse voltage, the induced leakage current in the CTIA circuit increase as well. As the pulse voltage exceeds one certain threshold point, the CTIA circuit fails to work anymore. The EMMI measurement helps to demonstrate the existence and location of the leakage path.

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Section: Discussionmentioning

confidence: 99%

Investigation of soft ESD failure on capacitive transimpedance amplifier for hybrid integrated infrared sensor

Wang

Xia

2020

IEICE Electron. Express

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Advanced fault localization techniques in microelectronics failure analysis

Chen

Yuan

et al. 2014

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)

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Failure analysis (FA) plays an important role in semiconductor industry as the process technology and new packaging are continuously improved. Fault localization is a key step to narrow down the area of failed part and isolate the defective areas, which is prior to destructive failure analysis. This paper will cover some advanced fault localization techniques and tools in package and die/device level failure analysis. Case studies for those techniques will provide a good understanding and illustrate the applications.

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