Application of Factor Analysis to the Resolution of Overlapping XPS Spectra

Abstract

Factor analysis has been used to resolve the overlapping XPS spectra obtained in the x-ray-induced transformation of Pt(en)2(OH)2Cl2 to Pt(en)2Cl2. This is achieved without prior knowledge of the data set nor the establishment of any initial curve fitting criteria.

Application of factor analysis in electron spectrometry (AES, XPS) for materials science

“…In materials science, the method has found application to series of spectra that show variations (AES [22,23], XPS [23,24], EELS [25], EDX [26]), to sets of images [27] and in spectrochemical imaging, e. g., to methods capable of recording spectra at every point of an image (e. g., ToF-SIMS [28], Imaging XPS [21]). Programs for FA of electron spectra are commercially available (PHI Multipak [29], CASA XPS [30]).…”

A Survey of Infrared Spectral Data Processing Techniques

“…This approach has been applied to a wide range of problems in which there is a linear relationship between the variables, including mass spectroscopy (Knorr and Futrell, 1979;Malinowski, 1978Malinowski, , 1982Ritter et al, 1976a;Petersen, 1975a,b, 1976) GC-MS (Sharaf and Kowalski, 1982;, chromatography (Malinowski, 1982;MacNaughtan et al, 1972;Howery et al, 1974;Selzer and Howery, 1975;Kindsvater et al, 1974;Parcher, 1972, 1973;Howery, 1974;Weiner et al, , 1974McCloskeg and Hawkes, 1975), nuclear magnetic resonance (Malinowski, 1978(Malinowski, , 1982Weiner et al, 1970;Weiner and Malinowski, 1971), fluorescence (Warner et al, 1977;Weber, 1961;, polarography (Howery, 1972), potentiometric measurements (Vadasdi, 1974) x-ray photoelectron spectroscopy (Gilbert et al, 1982), uv (Ohta, 1973;Edward and Wong, 1977), and ir (Antoon et al, 1979;McCue and Malinowski, 1981;Koenig and Tovar, 1981;Rasmussen et al, 1978;Chen and Gardner, 1983;Shurvell, 1973a,b, 1975;Shurvell and Bulmer, 1976;Shurvell and Dunham, 1978;Korppi-Tommola and Shurvell, 1979;Petelenz and Shurvell, 1980). This approach has been applied to a wide range of ...…”

“…A number of authors (Knorr and Futrell, 1979;Malinowski, 1982;Sharaf and Kowalski, 1982;MacNaughton et al, 1972;Gilbert et al, 1982;Ohta, 1973;Lawton and Sylvestre, 1971b;Gillette et al, 1983;Martens, 1979) have dealt with the problem of extracting pure components using algorithms similar to that just described. Although other procedures have been developed for rotating eigenvectors (e.g., varimax and quartimax (Rozett and Petersen, 1975a), these approaches can produce physically meaningless results in the form of negative ab= sorbances or concentrations.…”

Factor analysis and advanced inelastic background analysis in XPS: Unraveling time dependent contamination growth on multilayers and thin films

“…Factor analysis is a mathematical technique which reveals correlations between multidimensional data sets [9,10]. In a first step the common eigenvectors (spectra) and eigenvalues as the respective weights for reconstruction of the original data are obtained.…”

“…In a first step the common eigenvectors (spectra) and eigenvalues as the respective weights for reconstruction of the original data are obtained. Further rotation of these space coordinates identifies them with actual physical property vectors [9][10][11]. On close observation and quantification of these spectra, appropriate models of the investigated systems can be developed.…”