Application of Predictive Oscillation-Based Test to a CMOS OpAmp

Suenaga, K.; Isern, E.; Picos, R.; Bota, S.; Roca, M.; Garcı́a-Moreno, E.

doi:10.1109/tim.2009.2031381

Cited by 16 publications

(9 citation statements)

References 11 publications

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“…Predictive OBT (POBT) has been proposed as a solution to bring the advantages of OBT to a functional test framework [9]- [13]. POBT makes use of statistical post-processing tools to predict functional specifications of the DUT from its oscillation features in test mode.…”

Section: Brief Review Of Traditional Obt Strategiesmentioning

confidence: 99%

“…Thus, the work in [9] adds supply current monitoring to the measurement of oscillation characteristics, while the work in [10] adds the measurement of oscillation features at different internal nodes of the DUT. The proposal of Complex OBT (COBT) in [12], [13] also follows this trend by the exploitation of chaotic oscillation regimes, which is roughly equivalent to exciting the DUT with spectral-rich test patterns.…”

Section: Brief Review Of Traditional Obt Strategiesmentioning

confidence: 99%

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OBT for settling error test of sampled-data systems using signal-dependent clocking

Barragán

Léger

Huertas

2012

2012 17th Ieee European Test Symposium (Ets)

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Abstract-This work presents a modification of traditional Oscillation-Based Test schemes for sampled-data systems. This new test scheme is based on doubling the sampling frequency when the oscillation changes its sign. This way, the DC level of the output oscillation signal becomes a simple signature sensitive to the settling errors in the device under test and to its oscillation features. The proposed technique is illustrated on a switchedcapacitor second-order lowpass filter. This case study is used to show the sensitivity of the proposed signature to the linearity of the DUT. Electrical simulation results are provided to validate the proposal.

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Section: Brief Review Of Traditional Obt Strategiesmentioning

confidence: 99%

Section: Brief Review Of Traditional Obt Strategiesmentioning

confidence: 99%

OBT for settling error test of sampled-data systems using signal-dependent clocking

Barragán

Léger

Huertas

2012

2012 17th Ieee European Test Symposium (Ets)

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“…In the external tester, the oscillation is achieved by an external feedback loop network which is normally implemented as part of a dedicated tester. The OBT technique has been applied to various kinds of analogue and mixed-signal circuits [6][7][8][9][10][11][12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Hasan

Yanqing

Sun

2017

Circuits Syst Signal Process

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This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and faultfree simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.

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“…The OBT method is very promising because no external test stimulus is required, and the additional testing circuit can be easily embedded into the circuit under test. The OBT technique has been applied to various kinds of analogue and mixed‐signal circuits . As active analogue filters are widely used building blocks in radio frequency, analogue and mixed‐signal integrated circuits, significant OBT research has been conducted on low‐cost testing of analogue filters .…”

Section: Introductionmentioning

confidence: 99%

Design for testability of high‐order OTA‐C filters

Hasan

Yanqing

Sun

2016

Circuit Theory & Apps

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This is the peer-reviewed version of the following article: Masood-ul Hasan, Yanqing Zhu, and Yichuang Sun, ???Design for testability of high-order OTA-C filters???, International Journal of Circuit Theory and Applications, Vol. 44 (10): 1859-1873, October 2016, which has been published in final form at doi: 10.1002/cta.2200. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving. Copyright ?? 2016 John Wiley & Sons, Ltd.A study of oscillation-based test for high-order Operational Transconductance Amplifier-C (OTA-C) filters is presented. The method is based on partition of a high-order filter into second-order filter functions. The opening Q-loop and adding positive feedback techniques are developed to convert the second-order filter section into a quadrature oscillator. These techniques are based on an open-loop configuration and an additional positive feedback configuration. Implementation of the two testability design methods for nth-order cascade, IFLF and leapfrog (LF) filters is presented, and the area overhead of the modified circuits is also discussed. The performances of the presented techniques are investigated. Fourth-order cascade, inverse follow-the-leader feedback (IFLF) and LF OTA-C filters were designed and simulated for analysis of fault coverage using the adding positive feedback method based on an analogue multiplexer. Simulation results show that the oscillation-based test method using positive feedback provides high fault coverage of around 97%, 96% and 95% for the cascade, IFLF and LF OTA-C filters, respectively. Copyright ???? 2016 John Wiley & Sons, Ltd

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Application of Predictive Oscillation-Based Test to a CMOS OpAmp

Cited by 16 publications

References 11 publications

OBT for settling error test of sampled-data systems using signal-dependent clocking

OBT for settling error test of sampled-data systems using signal-dependent clocking

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Design for testability of high‐order OTA‐C filters

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