2020
DOI: 10.25392/leicester.data.12702323.v1
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Application of Search-Based Software Testing in Stress-Testing of Deeply Embedded Components in Integrated Circuits

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(3 citation statements)
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“…During the historical period, the IC was expanded with an increasing degree of functionality and other built-in components that became an integral part of this chip. The comprehensive functioning of the system is unstable due to the complexity and impossibility of testing the constituent components at a deep level [42].…”
Section: Modern Integrated Circuits (Ics)mentioning
confidence: 99%
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“…During the historical period, the IC was expanded with an increasing degree of functionality and other built-in components that became an integral part of this chip. The comprehensive functioning of the system is unstable due to the complexity and impossibility of testing the constituent components at a deep level [42].…”
Section: Modern Integrated Circuits (Ics)mentioning
confidence: 99%
“…The main reasons for the application are reflected in certain disadvantages and advantages of modern ICs [42]:…”
Section: Modern Integrated Circuits (Ics)mentioning
confidence: 99%
See 1 more Smart Citation