Abstract:The prospects for the application of X-ray spectral methods and scattering phenomena as a basis for chemical and phase analysis in new areas are considered. It is theoretically shown that the sensitivity of the scattering method does not depend on the structure and quality of the sample surface and increases sharply with a decrease in the atomic number of the analyzed impurity. The sensitivity of the method is analyzed in the study of multicomponent standards of stoichiometric composition based on H, Li, B, C,… Show more
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