Applying the Oscillation Test Strategy to FPAA’s Configurable Analog Blocks

Microelectronics Journal

et al. 2012

Section: Previous Work and Paper Contributionmentioning

confidence: 99%

A low-cost configurability test strategy for an embedded analog circuit

Laprovitta

Microelectronics Journal

et al. 2012

“…To this end, it is necessary to define a fault model. As the system addressed in this paper is configurable, we adopt fault models similar to those used by the authors of [26][27][28][29]. In these papers, the authors propose fault models for the evaluation of test strategies for field-programmable analog circuits.…”

Section: Fault Models and Fault Injectionmentioning

confidence: 99%

An Adaptive Amplifier System for Wireless Sensor Network Applications

Lovay

Journal of Electrical and Computer Engineering

et al. 2012

This paper presents an adaptive amplifier that is part of a sensor node in a wireless sensor network. The system presents a target gain that has to be maintained without direct human intervention despite the presence of faults. In addition, its bandwidth must be as large as possible. The system is composed of a software-based built-in self-test scheme implemented in the node that checks all the available gains in the amplifiers, a reconfigurable amplifier, and a genetic algorithm (GA) for reconfiguring the node resources that runs on a host computer. We adopt a PSoC device from Cypress for the node implementation. The performance evaluation of the scheme presented is made by adopting four different types of fault models in the amplifier gains. The fault simulation results show that GA finds the target gain with low error, maintains the bandwidth above the minimum tolerable bandwidth, and presents a runtime lower than exhaustive search method.

show abstract

“…However, the test of EACCs has been comparatively less explored. The first efforts for applying well-known test techniques to field programmable analog arrays (FPAAs) are reported in [6][7][8]. The authors apply oscillation-based test (OBT) for testing the configurable blocks of the ispPAC10 device from lattice and propose a test response analyzer configured in the device, evaluating its fault detection ability through fault injection in the capacitors, switches, and input amplifiers.…”

Section: Introductionmentioning

confidence: 99%

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Laprovitta

Journal of Electrical and Computer Engineering

2014