Nuclear Instruments and Methods in Physics Research Section B:
1992
DOI: 10.1016/0168-583x(92)95172-n
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Ar ion induced X-ray emission for the analysis of light elements in CdTe

A. Al Neami1,
A.Kadom Al Neami2,
C. Bordas3
et al.
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Cited by 7 publications
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References 10 publications
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PIXE analysis of heavy water from a nuclear power plant

Ozafrán
1
,
Vázquez
2
,
Kreiner
3
et al. 1993
Nuclear Instruments and Methods in Physics Research Section B:
16
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3
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PIXE analysis of heavy water from a nuclear power plant

Ozafrán
1
,
Vázquez
2
,
Kreiner
3
et al. 1993
Nuclear Instruments and Methods in Physics Research Section B:
16
0
3
0
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A study of the ionization of Al, Si, S, Sc, Ti and V by Ar ions in the energy range 1–5 MeV

Nekab1,
Pape2,
Heitz3
1994
Nuclear Instruments and Methods in Physics Research Section B:
2
0
0
0
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Application of a MeV nickel ion beam for PIXE analysis of iron near the surface of a silicon wafer

Horino
1
,
Mokuno
2
,
Kinomura
3
et al. 1995
Nuclear Instruments and Methods in Physics Research Section B:
2
0
0
0
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