2002
DOI: 10.1039/b210974n
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Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

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Cited by 20 publications
(11 citation statements)
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References 253 publications
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“…It is also noticeable that slurry introduction technique for analytical atomic spectrometry has been used for the analysis of many advanced materials, but details of various slurry preparation and characterization are still very scarce [13]. On the other hand, one should be cautious when slurry nebulization ICP-OES technique was used to analyze ceramic powders because the transport and nebulization efficiency are strongly influenced by particle size, the stability and homogeneity of the aqueous slurries [11,14,15].…”
Section: Introductionmentioning
confidence: 99%
“…It is also noticeable that slurry introduction technique for analytical atomic spectrometry has been used for the analysis of many advanced materials, but details of various slurry preparation and characterization are still very scarce [13]. On the other hand, one should be cautious when slurry nebulization ICP-OES technique was used to analyze ceramic powders because the transport and nebulization efficiency are strongly influenced by particle size, the stability and homogeneity of the aqueous slurries [11,14,15].…”
Section: Introductionmentioning
confidence: 99%
“…11 On the other hand, one should be more cautious when the slurry nebulization ICP-OES technique was used to analyze ceramic powders because the transport and nebulization efficiency are strongly influenced by the stability and homogeneity of the aqueous slurries. 9,12 Recently, Wang et al 13 reported the determination of metal impurities in titanium dioxide using slurry sample introduction with axial viewing ICP-OES and showed that preparation of a stable and homogeneous aqueous slurry is vital for the determination.…”
Section: Introductionmentioning
confidence: 99%
“…Even though X-ray fluorescence spectroscopy (XFS) is a sophisticated technique, it does not quantify the important lubricating grease components like lithium and boron in real samples [12]. Inductively coupled plasma atomic emission spectroscopy (ICP-AES) shows slight interference effects depending on the nature of sample [13]. However ICP-OES gives the better results with high specificity, sensitivity and reproducibility.…”
Section: Introductionmentioning
confidence: 99%