Atomistic Modeling of Defects Implicated in the Bias Temperature Instability

El-Sayed, Al-Moatasem; Shluger, Alexander L.

doi:10.1007/978-1-4614-7909-3_12

Bias Temperature Instability for Devices and Circuits 2013

DOI: 10.1007/978-1-4614-7909-3_12

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Atomistic Modeling of Defects Implicated in the Bias Temperature Instability

Al-Moatasem El-Sayed

Alexander L. Shluger²

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Atomistic Modeling of Defects Implicated in the Bias Temperature Instability

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References 58 publications

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