Russ. Electr. Engin.
 2015
DOI: 10.3103/s106837121510003x
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Automated electrical machine test facilities

R. V. Afenchenko
1
,
V. A. Barskii
2
,
D. S. Kurdyumov
3
et al.
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Automation of the design and development stages of semiconductor devices

Imanova1,
Fediakov2,
Tulegenov3
2018
IOP Conf. Ser.: Mater. Sci. Eng.
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Automation of the design and development stages of semiconductor devices

Imanova1,
Fediakov2,
Tulegenov3
2018
IOP Conf. Ser.: Mater. Sci. Eng.
0
0
0
0
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Control principles of AC electric drives

Kruglov
1
,
Gorozhankin
2
,
Buhtoyarov
3
2018
2018 17th International Ural Conference on AC Electric Drives (ACED)
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Designing Control Nodes for Mechatronic Modules by the Criterion of Minimal Losses

Kornienko1,
Fediakov2,
Bukhanov
3
2018
2018 International Multi-Conference on Industrial Engineering and Modern Technologies (FarEastCon)
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