Automated induction thermography system for surface crack in-line inspection

Guo, Wenhua; Ngo, C Y; Kumar, V. Anil

doi:10.21611/qirt.2020.022

Proceedings of the 2020 International Conference on Quantitative InfraRed Thermography 2020

DOI: 10.21611/qirt.2020.022

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Automated induction thermography system for surface crack in-line inspection

Wenhua Guo¹,

C Y Ngo²,

V. Anil Kumar³

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Automated induction thermography system for surface crack in-line inspection

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References 6 publications

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