2010
DOI: 10.1016/s0076-6879(10)83015-0
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Automation in Single-Particle Electron Microscopy

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Cited by 23 publications
(19 citation statements)
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“…Much effort has been invested in simplifying and automating the collection of EM images and the use of image processing software (reviewed in Lyumkis et al, 2010). The problematic issue with single-particle EM, however, is that there is still no objective quality criterion that is simple and easy to use, such as the R-free value in X-ray crystallography, that would allow one to assess whether the determined density map is accurate or not.…”
Section: Introductionmentioning
confidence: 99%
“…Much effort has been invested in simplifying and automating the collection of EM images and the use of image processing software (reviewed in Lyumkis et al, 2010). The problematic issue with single-particle EM, however, is that there is still no objective quality criterion that is simple and easy to use, such as the R-free value in X-ray crystallography, that would allow one to assess whether the determined density map is accurate or not.…”
Section: Introductionmentioning
confidence: 99%
“…Nanodiscs when viewed edgewise have a distinct high-contrast shape that allows the use of automated particle selection procedures to potentially generate the large data sets of particles necessary for high resolution analysis. [8][9][10] We have used a simple preparative procedure that preferentially displays the nanodiscs in edge-view, most useful for their identification and inherent angular variability. We have faced the problem of low contrast of the PA in these images, limiting the initial analysis to a modest (16 Å ) nominal resolution.…”
Section: Introductionmentioning
confidence: 99%
“…Automation is more than a means to save time and more than the mere elimination of a tedious repetitive task. It is a strategy that allows to gather data sets of unprecedented size and quality (Lyumkis et al, 2010).…”
Section: Discussionmentioning
confidence: 99%