DOI: 10.11606/t.43.2019.tde-24052021-152915
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Avaliação crítica da quantificação elementar (incluindo hidrogênio, carbono e oxigênio) por emissão de raios-X induzidos por prótons, PIXE, e por fluorescência de raios-X, XRF

Abstract: Among various analytical techniques, X-Ray Fluorescence (XRF) and Particle-Induced X-Ray Emission (PIXE) allow a highly sensitive, multi-elementary analysis, traditionally used in areas dealing with thin films, mineral, geological, archaeological and biological samples, etc. PIXE and XRF techniques allow quantifying the elemental composition of a sample measuring their characteristic X-rays. In thick homogeneous samples, the determination of the elemental mass concentrations requires prior knowledge of several… Show more

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