“…Among the methods discussed so far, LDV has some advantages for dynamics characterization in MEMS testing, as shown in Table 2.1. Measurements using LDV have high axial [51] and lateral resolutions [15]. The lateral resolution can achieve down to picometer resolution [41].…”
Section: Stroboscopic and Interferometric Methodsmentioning
The contributions of the coauthors are as follows:• I proposed the idea. Ting Liu, Kun Wu and I designed the experiments. iv • Kun Wu and I conducted the experiments.
“…Among the methods discussed so far, LDV has some advantages for dynamics characterization in MEMS testing, as shown in Table 2.1. Measurements using LDV have high axial [51] and lateral resolutions [15]. The lateral resolution can achieve down to picometer resolution [41].…”
Section: Stroboscopic and Interferometric Methodsmentioning
The contributions of the coauthors are as follows:• I proposed the idea. Ting Liu, Kun Wu and I designed the experiments. iv • Kun Wu and I conducted the experiments.
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