Basic Physics of Multiparameter Crystallography: Diagnostics of Defects of Several Types in Single-Crystal Materials and Articles of Nanotechnologies

З використанням раніше відкритого авторами явища дисперсійної (фазової) структурної чутливости картини багаторазового розсіяння створено теоретичні й експериментальні основи трикристальної динамічної дифрактометрії багатошарових кристалічних систем з неоднорідно розподіленими мікродефектами та макродеформацією. Враховано динамічний характер когерентного і дифузного розсіяння від дефектів у всіх шарах системи, а також багаторазовість розсіяння між шарами. С использованием ранее открытого авторами явления дисперсионной (фазовой) структурной чувствительности картины многократного рассеяния созданы теоретические и экспериментальные основы трёхкристальной динамической дифрактометрии многослойных кристаллических систем с неоднородно распределёнными микродефектами и макродеформацией. Учтены динамический характер когерентного и диффузного рассеяния от дефектов во всех слоях системы, а также многократность рассеяния между слоями. With using the previously discovered by authors phenomenon of dispersion (phase) structural sensitivity of multiple-scattering patterns, the theoretical and experimental bases of the triple-crystal dynamical diffractometry of multilayer crystalline systems with inhomogeneous strain and randomly distributed defects are created. The dynamical character of both coherent and diffuse scattering from defects in all the layers of the system as well as the multiple scattering between layers are taken into account.

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Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films

Skakunova¹,

Olikhovskii²,

Molodkin³

et al. 2016

Metallofiz. Noveishie Tekhnol.

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Basic Physics of Multiparameter Crystallography: Diagnostics of Defects of Several Types in Single-Crystal Materials and Articles of Nanotechnologies

Cited by 1 publication

References 28 publications

Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films

Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films

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