“…These values have been compared with experimental results from other studies to follow the same range as the reported data. ,, In addition to these parameters, dopant concentrations have been included with a donor density of 10 19 cm –3 for ZnO and an acceptor density of 10 14 cm –3 for Cu 2 O thin films. These values were chosen on the basis of average values found in the literature. − Additionally, defects were assumed to be neutral, since they are the ones that contribute the most to the Schockley–Read–Hall (SRH) recombination phenomena . In this recombination model, the carrier lifetime is calculated using the following equation: where N t represents the defect density; V th , 10 7 cm/s, the thermal velocity; and σ X the defect capture cross-section with σ n , 10 –14 cm 2 , and σ p , 10 –15 cm 2 , for Cu 2 O and σ n , 10 –15 cm 2 , and σ p , 10 –14 cm 2 , for ZnO …”