BIST scheme for RF VCOs allowing the self-correction of the cut

Testa, Luca; Lapuyade, Hervé; Deval, Yann; Mazouffre, Olivier; Carbonero, J.L.; Bégueret, Jean-Baptiste

doi:10.1109/test.2009.5355721

2009 International Test Conference 2009

DOI: 10.1109/test.2009.5355721

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BIST scheme for RF VCOs allowing the self-correction of the cut

Luca Testa

Hervé Lapuyade

Yann Deval

et al.

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BIST scheme for RF VCOs allowing the self-correction of the cut

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References 12 publications

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