Bit line coupling scheme and electrical fuse circuit for reliable operation of high density DRAM

Lim, Kyu-Nam; Kang, S. K.; Choi, Jonghyun; Joo, Jae-Hoon; Lee, Younsang; Lee, Jin-Seok; Cho, Soo-In; Ryu, Byung-Il

doi:10.1109/vlsic.2001.934186

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Bit line coupling scheme and electrical fuse circuit for reliable operation of high density DRAM

Cited by 5 publications

References 3 publications

A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die

A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die

A low-power 256-Mb SDRAM with an on-chip thermometer and biased reference line sensing scheme

A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die

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