BIXS for tritium analysis with Ar gas and Al thin film as β-ray stopping layers and comparison with EBS

Chen, H.; Ding, W. M.; An, Zhu; Zhu, J. J.; Liu, M.T.; He, Tie; Zhang, Z.

doi:10.1016/j.radphyschem.2020.108931

Radiation Physics and Chemistry

2020

DOI: 10.1016/j.radphyschem.2020.108931

|View full text |Cite

BIXS for tritium analysis with Ar gas and Al thin film as β-ray stopping layers and comparison with EBS

H. Chen

W. M. Ding

Zhu An

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2021

2024

Publication Types

Select...

Article3

Relationship

Self Cite0

Independent3

Authors

Journals

Cited by 3 publications

References 46 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

Utilizing BP neural networks to accurately reconstruct the tritium depth profile in materials for BIXS

Zhao,

Jin,

Shi

et al. 2024

NUCL SCI TECH

View full text Add to dashboard Cite

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

BIXS for tritium analysis with Ar gas and Al thin film as β-ray stopping layers and comparison with EBS

Cited by 3 publications

References 46 publications

Utilizing BP neural networks to accurately reconstruct the tritium depth profile in materials for BIXS

Utilizing BP neural networks to accurately reconstruct the tritium depth profile in materials for BIXS

Tritium analysis in zirconium film with BIXS and EBS: Generality test of Al thin film as the β-ray stopping layer in BIXS

Bremsstrahlung of 5–25 keV electrons incident on MoSi2, TiB2 and ZrB2 thick solid conductive compounds

Contact Info

Product

Resources

About