Broadband high-resolution terahertz single-pixel imaging

Vallés, Adam; He, Jiahuan; Ohno, Seigo; Omatsu, Takashige; Miyamoto, Katsuhiko

doi:10.1364/oe.404143

Cited by 31 publications

(21 citation statements)

References 46 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The compressing approach in THz can be demonstrated using optical photoexcitation of semiconductors to dynamically and spatially control electromagnetic properties of a semiconductor mask to collectively form a THz spatial light modulator [251][252][253]. Another type of pixel-controlled tunable mask is metamaterial patterns, including the formate of plastic plate coppered with designed distributions [254], spinning disk plated with metal diagrams [255,256], and all-electric controlled active metamaterial real-time spatial mask [257]. By using the optical induced modulation, a THz video (32 × 32 pixels by using pulse radiation) with the frame rate of 6 Hz of has been achieved [252].…”

Section: Thz Computational Imagingmentioning

confidence: 99%

Roadmap of Terahertz Imaging 2021

Valušis

Lisauskas

Yuan

et al. 2021

Sensors

193

View full text Add to dashboard Cite

In this roadmap article, we have focused on the most recent advances in terahertz (THz) imaging with particular attention paid to the optimization and miniaturization of the THz imaging systems. Such systems entail enhanced functionality, reduced power consumption, and increased convenience, thus being geared toward the implementation of THz imaging systems in real operational conditions. The article will touch upon the advanced solid-state-based THz imaging systems, including room temperature THz sensors and arrays, as well as their on-chip integration with diffractive THz optical components. We will cover the current-state of compact room temperature THz emission sources, both optolectronic and electrically driven; particular emphasis is attributed to the beam-forming role in THz imaging, THz holography and spatial filtering, THz nano-imaging, and computational imaging. A number of advanced THz techniques, such as light-field THz imaging, homodyne spectroscopy, and phase sensitive spectrometry, THz modulated continuous wave imaging, room temperature THz frequency combs, and passive THz imaging, as well as the use of artificial intelligence in THz data processing and optics development, will be reviewed. This roadmap presents a structured snapshot of current advances in THz imaging as of 2021 and provides an opinion on contemporary scientific and technological challenges in this field, as well as extrapolations of possible further evolution in THz imaging.

show abstract

Section: Thz Computational Imagingmentioning

confidence: 99%

Roadmap of Terahertz Imaging 2021

Valušis

Lisauskas

Yuan

et al. 2021

Sensors

193

View full text Add to dashboard Cite

show abstract

“…Further, observing hydration changes in a leaf due to intense light exposure over a 15 minute period has also been demonstrated [52]. Other recent studies include demonstrating a spinning disc system working from 3 to 13 THz using random masks [45]. Reference [94] shows how random, Hadamard and masks based on the discrete cosine transform perform in the THz regime and reference [95] studied Hadamard vs. Fourier masks in the context of undersampling performance.…”

Section: Applications and Discussionmentioning

confidence: 98%

“…Otherwise, their frequency response is going to be again to be determined by the reflection of a metal hence it is very broad. Such SLMs are probably most compatible for THz spectrometers that can measure between 1 and 30 THz [45], such as those based on airplasma [96], spintronic [77] and organic EO crystals [80] emission techniques. This is of course compared to conductivity based SLMs of §3.2.…”

Section: Applications and Discussionmentioning

confidence: 99%

See 1 more Smart Citation

Spatial Terahertz-Light Modulators for Single-Pixel Cameras

Stantchev¹,

Pickwell‐MacPherson²

2022

Terahertz Technology

View full text Add to dashboard Cite

Terahertz imaging looks set to become an integral part of future applications from semiconductor quality control to medical diagnosis. This will only become a reality when the technology is sufficiently cheap and capabilities adequate to compete with others. Single-pixel cameras use a spatial light modulator and a detector with no spatial-resolution in their imaging process. The spatial-modulator is key as it imparts a series of encoding masks on the beam and the detector measures the dot product of each mask and the object, thereby allowing computers to recover an image via post-processing. They are inherently slower than parallel-pixel imaging arrays although they are more robust and cheaper, hence are highly applicable to the terahertz regime. This chapter dedicates itself to terahertz single-pixel cameras; their current implementations, future directions and how they compare to other terahertz imaging techniques. We start by outlining the competing imaging techniques, then we discuss the theory behind single-pixel imaging; the main section shows the methods of spatially modulating a terahertz beam; and finally there is a discussion about the future limits of such cameras and the concluding remarks express the authors’ vision for the future of single-pixel THz cameras.

show abstract

“…9 Transmission of the imaging area within the metallic ring (blue diamonds) and of a standard PCB substrate (red circles). 117 THz measurements and their response from a PCB. This is important as the modeling of THz sample interactions enable higher spatial resolution characterization.…”

Section: Pcb and Thz Radiation Interactionmentioning

confidence: 99%

Review of THz-based semiconductor assurance

True

Jessurun

et al. 2021

Opt. Eng.

View full text Add to dashboard Cite

Terahertz radiation for inspection and fault detection has been of interest for the semiconductor industry since the first generation and detection of THz signals. Until recent hardware advances, THz systems lacked the signal quality and reliability for use as an effective nondestructive testing (NDT) method. Incremental advances in THz sources, detectors, and signal processing resulted in the successful applied-industrial use of THz NDT techniques on carbon fiber laminates, automotive coatings, and for detection of counterfeit pharmaceutical tablets. Semiconductor inspection and verification methods ensure the functionality and thereby safety of vital electronics for several critical industries. For this reason, the reliability and verification of a THz NDT method must exceed currently used inspection systems. With recent laboratory access to THz radiation, THz inspection methods are often compared with existing optical, electrical, and volumetric semiconductor verification techniques for their production monitoring and failure analysis viability. This review will cover THz techniques and their applications at the printed circuit board (PCB), integrated circuit (IC), and transistor/gate scales. The THz radiation gap spans between optical and electronic ranges with a millimeter-sized wavelength allowing for adequate penetration of plastic and ceramic and semiconductor materials. THz radiation can be used to determine structural features, electrical signatures in the THz range, and chemical information simultaneously. Cost and environmental limitations restricted the ability for THz NDT semiconductor inspection methods to escape the lab and succeed in the dynamic environment of a semiconductor fabrication environment. Hybridized metrology methods incorporating information from multiple inspection tools are a regime where THz spectral and structural data can be combined with existing methods such as optical, x-ray, or E-beam. THz can be used initially to offer support to the complex failure analysis and verification requirements of the semiconductor industry from nanoscale to macroscale features and components. For THz systems to become independent inspection tools used for semiconductor production monitoring, in the lab or fab, this will require a confident level of statistical process control for THz signal generation, detection, or processing. Applied industrial semiconductor device inspection will likely be a result of a combination of research into THz hardware, reconstruction techniques, and the widespread application of machine learning techniques. Many breakthroughs occurred over the years to enable successful nondestructive characterization and inspection of semiconductor devices from the nanoscale transistors to fully packaged integrated circuits and assembled PCBs.

show abstract

Broadband high-resolution terahertz single-pixel imaging

Cited by 31 publications

References 46 publications

Roadmap of Terahertz Imaging 2021

Roadmap of Terahertz Imaging 2021

Spatial Terahertz-Light Modulators for Single-Pixel Cameras

Review of THz-based semiconductor assurance

Contact Info

Product

Resources

About